Measurement as a Service

Measurements for datasheets or qualification tests on power semiconductors - SiC, Si, GaN, discretes or modules. Use our measurement service to obtain the characteristic values that are relevant for you and your application.
We can also perform dynamic tests on your designed system. Possible use cases are reliability testing or system or design verification.

Your Benefits

  • Wide range of possible operating points
  • Measurement of SiC, Si, GaN in Discretes, Modules or full circuits
  • Technical support for selecting suitable measurement equipment
  • Delivery of measurement report with extracted values and raw data

Contact us

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